The Agilent / HP 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 1 fA to 100 mA (20 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs, synchronized stress/measure function, two high-voltage pulse generator units (+/- 40 V), time domain measurement: 60 micro s - variable intervals, up to 10,001 points, easy to use: knob-sweep similar to curve tracer, automatic analysis functions, and automation: built-in HP Instrument BASIC, trigger I/Q capability. With the 4155A, you can improve your semiconductor quality, from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis. If you are interested in the AGILENT-HP 4155A or items similar to it, please do not hesitate to contact us for more information. Our sales representatives will be happy to provide you with the most up-to-date information about the AGILENT-HP 4155A , as well as helping you find the product solution that fits your needs. - Model: 4155A
- Manufactured by: Agilent-HP
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