Scientific Test 5300HX Curve Tracers
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Scientific Test 5300HX Details
Scientific Test 5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. With an on-board SBC,the tester can provide high-speed, stand alone (after test program download) testing capability; or, when connected to a PC, provide intuitive test development and data capture including optional curve trace and wafer mapping.
Current Ranges:
- Standard: 1.0nA - 50A
- Mainframe Extension to 100A
- Low Current Option: 20pA
- High Current Options: up to 1200A
Voltage Ranges:
- Standard (Anode): 10mV - 1000V
- 2000V with 2KV Anode Option
- Standard (Gate) : 10mV - 20V
- 80V with 80V Gate Option
- High Speed ADC (Single Test Measurement)
- Fast Data Capture
- Handler Interface (16 Logical Bins)