Quadtech Guardian 20KVDC

Hipot Tester

In all cases, both high and low limits are operator programmable for quick, and easy pass/fail testing. These dual limits are essential to ensure that the device under test is actually making contact with the tester. For consistent testing, up to 50 setups can be stored in instrument memory for later recall. An optional high voltage scanner is also available for testing multi-connection devices.

Features

• DC Hipot Voltage 100 to 20,000V, Output Current to 5mA
• IR Measurements 100k? to 50G?, Test Voltage 50 to 1000VDC
• Programmable Ramp and Test Times
• Fast Cutoff and Quick Discharge of Device Under Test
• Programmable Hi/Lo Limits for Pass/Fail Testing
• LCD Display for Menu Programming and Test Results
• Internal Storage and Recall of 50 Test Setups, 10 Steps Each
• Front and Rear Panel Output Connections
• Front Panel Lockout Prevents Changes to the Test Setup
• Automatic Offset to Zero Out Stray Leakage Current
• Remote I/O Interface Included Standard
• RS-232 Interface Optional
• IEEE-488 and Printer Interfaces Optional
• External 8 Channel Scanner Optional

  
  
  
  
  Quadtech Guardian 20KVDC datasheet & specifications